A NIST traceable light source to enable
radiometric correction of a spectrometer
output. Primarily for use with any
microscope based spectrometer system
How The SYLPH Hyperspectral Radiometric Calibration Light Source Works
Why Calibrating A Hyperspectral Spectrometer Is Necessary:
Instrument to instrument variability: Unless they have been “standardized” all
spectrometers will characterize a reference emission spectrum differently. This is a
function of many issues including variations in detector efficiency, bandpass and
various system optics
Uncertainties in wavelength ratios: If a sample spectrum covers an extended
spectral range, wavelength ratios may vary between instruments due to
instrumental component variables. If measuring accurate wavelength ratios is
necessary then the data delivered by an instrument needs to be “normalized” to a
standard.
By using a NIST certified lamp spectra are acquired in power (µW/cm2/nm).
However, in most optical assemblies, the power output will be relative not
absolute.
Without correction, data will be highly reproducible, yet wavelength ratios will be
“precisely inaccurate.” The main wavelength dependent culprits include:
•
The quantum efficiency (QE) of the spectrum detector such as a CCD or
CMOS camera or photomultiplier tube (PMT)
•
The wavelength versus efficiency profile of a diffraction grating or prism
•
Variations between electronic bandpass filters such as Acousto Optic Tunable
Filters (AOTF), Liquid Crystal Tunable Filters (LCTF) or interferometers.
•
Optical coatings, lenses, mirrors, filters, polarizers and any other optic that is
located between the sample and the detector
Aliasing when the system fails to accurately reconstruct an analog spectrum into a
digital format.
The impact of all these influences are eliminated when a spectrum is acquired in
%transmission, absorption, or %reflection. In these cases, the sample spectrum is
divided by a spectrum of the illumination source that has also passed through the
same system.
However, in emission spectroscopy including LED, OLED photo-luminescance
fluorescence, and Raman there is no illuminant spectrum to divide by. Therefore,
in order to accurately reconstruct wavelength ratio intensities, it is necessary to
apply a correction factor at each wavelength.
After radiometric calibration
a correction an instrument
will acquire an identical
spectrum to the NIST
certification in µW/cm2/nm
LED spectrum before radiometric
correction in arbrary units
LED spectrum after radiometric
correction in relative µW/cm2/nm
The SYLPH, NIST Certified, Radiometric Calibration Solution
The accepted way to normalize any spectrometer is to acquire a spectrum of NIST certified characteristics. For
wavelength accuracy use an absolute light source such as the MIDL Hg/Ar emission lamp. For wavelength versus
intensity use a NIST certified emission lamp such as the “SYLPH” radiometric calibration light source.
The SYLPH radiometrically calibrated light source delivers a stable, NIST-certified spectrum of known
characteristics. This provides a spectral microscope or spectral confocal system with a certified traceable
“reference emission.”
To standardize a system determine a correction curve by acquiring a spectrum of the SYLPH lamp and compare it
to the spectrum described in the certificate. After applying the correction curve the spectrometer will reconstruct
the spectrum of the SYLPH lamp and accurately reconstruct the spectrum of any other sample.
Once this correction factor has been incorporated in the data processing software it should be applied to all future
acquisitions.
Bottom line: All radiometrically calibrated instruments will accurately reproduce the same reference spectrum.
Once an instrument has been radiometrically corrected all spectra acquired on that instrument can be compared
with those acquired on other radiometrically calibrated instrument.
Source
Wavelength range:
Warm-up time:
Bulb power:
Source lifetime:
Calibrated for:
Stability of optical output:
Drift of optical output:
Operating temperature:
Humidity:
Power Consumption:
Tungsten halogen
360-2400 nm
10 minutes at 23deg ambient
4.75 W (nom)
10,000 hrs (typical)
Absolute irradiance (µW/cm2/nm)
0.15% peak-to-peak
<0.3% per hour
5 °C – 35 °C
5-95% without condensation at 40 °C
up to 15 W
SYLPH: Radiometric Calibration System Specifications
“SYLPH™” Standard Yield Lamp for Photonic Calibration
NIST Certified radiometric
power spectrum as a function
of wavelength in relative
µW/cm2/nm
Relative spectrometer spectrum
of the NIST lamp before
correction in arbitrary units
The SYLPH radiometric calibration system setup (not to scale. The
illumination head is placed facing the microscope objective
SYLPH™: Radiometric Calibration Light Source