PARISS® Hyperspectral Microscopy

PARISS Microscope Mounted Hyperspectral Imaging System
The PARISS Model “PHSI” operates in field scanning mode in darkfield scatter, fluorescence, luminescence, %transmission, %reflection and absorption.
PARISS Hyperspectral Work Flow
Hyperspectral microscopy work flow
Prism based imaging spectrometer for extended wavelength range and light throughput (prism vs diffraction grating details) Mounting interface: “C” mount to most research upright and inverted microscopes Wavelength range: 360 to 920-nm simultaneously Spectral resolution: ~1-nm at 436-nm PARISS imaging spectrometer (Details) Scientific CCD/CMOS spectrum detector Observed image scientific CCD/CMOS Data processor Computer operated microscope stage Custom hyperspectral microscopy software. See here Includes a MIDL calibration lamp to validate wavelength accuracy Optional: NIST certified light source. Optional Xenon illuminator for darkfield nanoparticle characterization Calibration standards: Available MIDL wavelength calibration lamp and a “SYLPH” NIST certified radiometric light source. Sold either as an accessory to an existing microscope or as a complete system, contact LightForm.
Hyperspectral microscopy correlates spectra presented by the field of view (FOV) with spectra in a reference spectral library (RSL). An unlimited FOV is acquired by placing a sample on a slide mounted on a computer controlled translation stage on a microscope. The sample is illuminated with white light for darkfield scatter, %transmission or %reflection, or with a laser for fluorescence or other excited states. To see a video that describes how the PARISS hyperspectral microscope works click here. Each object in the field of view will present a spectrum. If there are tens of thousands of objects, then PARISS will acquire tens of thousands of spectra many of which are common. The challenge associated with handling thousands of unique and often common spectra is handled with custom software that sorts and classifies all spectra in the FOV. All or some classes of spectra can then be entered into an RSL. Each library spectrum can be pseudo- colored and linked to a unique target “spectral object”. The presence of one or more pseudo-colors then confirms the location and presence of a target object. Future samples can then be scanned, and the spectra presented by all objects in the FOV will be correlated with those in the library. Those that meet a minimum correlation coefficient will then be “painted” onto a gray scale image. Various data processing options including counting correlated objects and various mathematical functions.
Hyperspectral imaging basics
The PARISS hyperspectral microscope acquires many thousands of spectra over an unlimited field of view (FOV). The PARISS software evaluates all spectra and sorts them into “classes.” One class will likely be “background spectra,” the remaining spectra will be target objects. Some, or all, classes of spectra can be added into an RSL. Each library spectrum will be pseudo colored either by the software or the instrument user. All, or selected spectra from the FOV that correlate with a library spectrum, will then be “painted” with pixel- perfect accuracy onto a grayscale image of the FOV.
Email: info(@)lightforminc.com Tel: +1(908) 281-9098 LightForm, Inc. 825C Merrimon Ave., Suite 351 Asheville NC 28804 USA  Copyright © LightForm, Inc., 2022  | Pioneering Analytical Hyperspectral Microscopy Since 1996 PARISS ® is a registered trademark of LightForm, Inc   Mailing address Contact Contact LightForm Contact LightForm

PARISS® Hyperspectral

Microscopy

 PARISS Microscope Mounted Hyperspectral Imaging System
The PARISS Model “PHSI” operates in field scanning mode in darkfield scatter, fluorescence, luminescence, %transmission, %reflection and absorption.
Scientific CCD/CMOS spectrum detector Observed image scientific CCD/CMOS Data processor Computer operated microscope stage Custom hyperspectral microscopy software. See here Includes a MIDL calibration lamp to validate wavelength accuracy Optional: NIST certified light source. Optional Xenon illuminator for darkfield nanoparticle characterization Calibration standards: Available MIDL wavelength calibration lamp and a “SYLPH” NIST certified radiometric light source. Sold either as an accessory to an existing microscope or as a complete system, contact LightForm.
Hyperspectral microscopy correlates spectra presented by the field of view (FOV) with spectra in a reference spectral library (RSL). An unlimited FOV is acquired by placing a sample on a slide mounted on a computer controlled translation stage on a microscope. The sample is illuminated with white light for darkfield scatter, %transmission or %reflection, or with a laser for fluorescence or other excited states. To see a video that describes how the PARISS hyperspectral microscope works click here. Each object in the field of view will present a spectrum. If there are tens of thousands of objects, then PARISS will acquire tens of thousands of spectra many of which are common. The challenge associated with handling thousands of unique and often common spectra is handled with custom software that sorts and classifies all spectra in the FOV. All or some classes of spectra can then be entered into an RSL. Each library spectrum can be pseudo-colored and linked to a unique target “spectral object”. The presence of one or more pseudo-colors then confirms the location and presence of a target object. Future samples can then be scanned, and the spectra presented by all objects in the FOV will be correlated with those in the library. Those that meet a minimum correlation coefficient will then be “painted” onto a gray scale image. Various data processing options including counting correlated objects and various mathematical functions.
Hyperspectral imaging basics
Email: info(@)lightforminc.com Tel: +1(908) 281-9098 LightForm, Inc.,825C Merrimon Ave., Suite 351Asheville NC 28804 USA Copyright © LightForm, Inc., 2022  | Pioneering Analytical Hyperspectral Microscopy Since 1996  PARISS ® is a registered trademark of LightForm, Inc Mailing address Contact
PARISS imaging spectrometer (Details)
Prism based imaging spectrometer for extended wavelength range and light throughput (prism vs diffraction grating details) Mounting interface: “C” mount to most research upright and inverted microscopes Wavelength range: 360 to 920-nm simultaneously Spectral resolution: ~1-nm at 436-nm